Comparison ledger
LTX-Credence Fusion HFT, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Fusion HFTLTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence Fusion | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Primary BU | ENT[1] | — |
| Development | NPI / Production[1] | — |
| Instrument | Fusion HFI[1] | — |
| Configuration | Solaris[1] | — |
| Digital Pin | 512[1] | — |
| Primary Business Unit | ENT[1] | — |
| Development Phase | NPI / Production[1] | — |
| Software | Solaris[1] | — |
| Digital Pins | 512[1] | — |
| Cage 0 Components | Workstation, VME Crate VX4, AC/DC MPDU Crate, CPS (8 Channels), DPS (4 Channels), SMS (2 Channels), Analog Pin AP (16 Channels), RF 3500 (4 Channels), RF Generator R&S (3), Test Head User Power Supplies, Time Measurement Unit[1] | — |
| Cage 1 Components | Testhead Digital Card Cage (512 Channels) PECVX, Power Supplies for Digital, Cooler, CTMU MUX / Wavecrest, DPRO 4 for VX4 (0 to 127 Channel)[1] | — |
| Vintage | 2004[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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