Comparison ledger
LTX-Credence Fusion LX, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Fusion LXLTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 2006– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence Fusion LX | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Model | Fusion LX[1] | JR-A-F4T[5] |
| Make | LTX / Credence[1] | — |
| Category | Test & Probe[2] | — |
| Instrument slots | 20[3] | — |
| Digital pins | 128[3] | — |
| Capabilities | X-Series full range of DSP, DC and power capabilities[4] | — |
| System type | Test system[3] | — |
| X-Series capabilities | DSP, DC, and power capabilities[3] | — |
| Loadboard interface | direct loadboard interface[3] | — |
| Mainframe requirement | does not require a mainframe[3] | — |
| Control platform | Linux based PC tester controller[3] | — |
| Production capability | complete production solution[3] | — |
| Digital performance | up to 400Mb/s[3] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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