Comparison ledger
LTX-Credence Kalos 2 HEX, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Kalos 2 HEXLTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence Kalos 2 HEX | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | PCB Board (4)[1] | — |
| Make | LTX / Credence[1] | — |
| Model | Kalos 2 HEX[1] | JR-A-F4T[4] |
| Category | Test & Probe[2] | — |
| Family entry | LTX-Credence Kalos 2 HEX family[3] | — |
| Documented model | Kalos 2 HEX Tester[3] | — |
| Configuration / options | PCB Board (4), Backup PCB, 3 PCB failed[2] | — |
| Vintage | 2004[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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