Comparison ledger
LTX-Credence MX 40, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MX 40LTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence MX 40 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | 1 Linux Workstation “X2” Config Quad Core, AVNET[2] | — |
| OVI Pins | 64 OVI Pins, 16V, 550mA/1A, 1CBit/Pin[2] | — |
| HVVI Pins | 64 HVVI Pins, 100V, 500mA Pulsed[2] | — |
| HVVI / PPVI / FS Power Supply | 4 HVVI / PPVI / FS Power Supply[2] | — |
| AWG HSB Pins | 2 AWG HSB Pins, 16 Bit, 250Ms/sec[2] | — |
| Digitizer HSB Pins | 8 Digitizer HSB Pins, 14 Bit, 100Ms/sec[2] | — |
| FX1200MHz Digital Pins | 128 FX1200MHz Digital Pins[2] | — |
| FX High Voltage Digital Pins | 32 FX High Voltage Digital Pins[2] | — |
| Workstation | 1 Linux Workstation "X2" Config Quad Core, AVNET[2] | — |
| Monitor | 1 Flat Panel Monitor – 22"[2] | — |
| DSP Send and Receive | 1 DSP Send and Receive[2] | — |
| FX Time Multi-Processor Option | 2 FX Time Multi-Processor Option[2] | — |
| Enhanced Timing Distribution Board | 2 Enhanced Timing Distribution Board[2] | — |
| Dual Crate Infrastructure for FX Digital Pins | 1 Dual Crate Infrastructure for FX Digital Pins[2] | — |
| OFVI Pins | 8 OFVI Pins[2] | — |
| QFVI Supply | 2 QFVI Supply[2] | — |
| Digital Pins | 128 FX1200MHz Digital Pins[2] | — |
| High Voltage Digital Pins | 32 FX High Voltage Digital Pins[2] | — |
| DSP | 1 DSP Send and Receive[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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