Comparison ledger
LTX-Credence X-Series MX, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | X-Series MXLTX-Credence | |
|---|---|---|
| OEM | LTX-Credence | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence X-Series | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Tester OS | Unison 4.2.0[1] | — |
| Tester PC | PC-X1[1] | — |
| Configuration | slot1: STEPBUSⅡ_ADAP_NEW[1] | — |
| slot2 | OCTAL_VI[1] | — |
| slot3 | HCOVI[1] | — |
| slot4 | DCTM[1] | — |
| slot6 | HVVI[1] | — |
| slot8 | QFVI_VI[1] | — |
| slot9 | QTMP[1] | — |
| slot10 | SWGHSB[1] | — |
| slot12 | DIGHSB[1] | — |
| slot14 | HEX_VI[1] | — |
| slot15 | TH_PECFX2[1] | — |
| slot16 | TH_PECFX2[1] | — |
| slot17 | TH_THBDFX_DIR_TMP_REFCLK[1] | — |
| slot18 | TH_PECFX2[1] | — |
| slot19 | TH_PECFX2[1] | — |
| slot20 | HEX_VIB[1] | — |
| slot33 | STEPBUSⅡ_ADAP_NEW[1] | — |
| slot34 | OCTAL_VI[1] | — |
| slot1 | STEPBUSⅡ_ADAP_NEW[1] | — |
| slot49 | TH_THBDFX_DIR_TMP_REFCLK[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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