Comparison ledger
Mahr MMQ 40 Form, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MMQ 40 FormMahr | |
|---|---|---|
| OEM | Mahr | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Mahr MMQ 40 Form | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | High precision sphere for accuracy[1] | — |
| OEM | Mahr[1] | — |
| Model | MMQ 40[1] | JR-A-F4T[3] |
| Equipment type | Form tester[1] | — |
| High precision sphere | 50 mm[1] | — |
| Circular deviation | 0.00004 mm[1] | — |
| Probe compatibility | MFU / MMR / MMQ[1] | — |
| Adjustable angle | 110 degrees[1] | — |
| Adjustable measuring force | 0.5 to 0.005 N[1] | — |
| Type | MMQ 40[2] | — |
| Workpiece diameter | up to 350 mm[2] | — |
| Workpiece length | up to 450 mm[2] | — |
| Control | CNC-controlled[2] | +/-1.0°C[3] |
| Evaluation system | Form PC[2] | — |
| Included peripherals | TFT monitor, keyboard, mouse, printer[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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