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P 300 J Waferversus, TPS JR-A-F4T Junior compact temperature test chambers

Micromanipulator P 300 J Wafer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.

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Side-by-side comparison of selected equipment models
Attribute
P 300 J WaferMicromanipulator
OEMMicromanipulatorTenney
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyMicromanipulator P 300 J WaferTenney , TPS JR-A-F4T Junior compact temperature test chambers
Specifications
Wafer size300 mm[1]—
Stage range300 x 300 x 50 mm, theta 15 degrees[1]—
Resolution0.1 micron (stage, platen, microscope drive)[1]—
Microscope drive range100 x 100 mm (X-Y), 200 mm (Z)[1]—
Station dimensions (W x D x H)33 x 40 x 33 inches (84 x 102 x 84 cm)[1]—
Station weight480 lbs (218 kg)[1]—
RMC-7 controller dimensions17.8 x 19.7 x 5.5 inches (45.2 x 50 x 13.9 cm)[1]—
RMC-7 controller weight24 lbs (11 kg)[1]—
Vacuum requirement25 in-Hg[1]—
Controller power input85 to 265 VAC, 47-63 Hz, 2.4 Amps typical[1]—
Temperature ranges (configurable)Ambient to 300°C, 0°C to 300°C, -55°C to 300°C[2]—
Platen materialMagnetic stainless steel[1]—
Chamber Size—1.2 cubic feet[3]
Temperature Range—-68°C to +180°C[3]
Control—+/-1.0°C[3]
Manufacturer—Tenney[3]
Model—JR-A-F4T[3]
Short description—Junior compact temperature test chambers[3]
Control accuracy—+/-1.0°C[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]micromanipulator.commicromanipulator.com
  2. [2]mercia-semiconductor.commercia-semiconductor.com
  3. [3]dealer listingwotol.com