Comparison ledger
Multitest MT 9510 Tri-Temp, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT 9510 Tri-TempMultitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | 2003 | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest MT 9510 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Non operational[2] | — |
| Tri-temperature | -55°C - +150°C[3] | — |
| Temperature range | -55°C to +150°C[3] | — |
| Test site parallelism | Up to x16[3] | — |
| Year of manufacture | 2003[3] | — |
| Equipment type | Test handler[2] | — |
| Parallelism | Up to x16 test site parallelism[3] | — |
| Vintage | 2003 vintage[3] | — |
| Operational status | Non operational[2] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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