Comparison ledger
Multitest MT 9510, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT 9510Multitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | 2001 | — |
| Production run | 2001– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest MT 9510 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Configuration | VC1/10S3E BGA[2] | — |
| Max temp | 175*C[6] | — |
| System | STD[7] | — |
| Temperature Range | -40/ 155[7] | -68°C to +180°C[14] |
| Installed Kit | TQFP 7x7[7] | — |
| parallelism | Up to x16 test site parallelism[11] | — |
| temperature range | -55°C to +150°C[11] | — |
| throughput | Up to 5,300 UPH[12] | — |
| package support | QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF[12] | — |
| package size | 3 x 3 mm to 70 x 70 mm[12] | — |
| index time | 0.38 seconds (XP) and 0.65 seconds (x16)[12] | — |
| footprint | 1.19 m x 1.57 m (47 in x 62 in)[12] | — |
| weight | 850 kg (1,900 lbs)[13] | — |
| device size | 3 mm x 3 mm to 14 mm x 14 mm (for up to 8 contact sites)[13] | — |
| Chamber Size | — | 1.2 cubic feet[14] |
| Control | — | +/-1.0°C[14] |
| Manufacturer | — | Tenney[14] |
| Model | — | JR-A-F4T[14] |
| Short description | — | Junior compact temperature test chambers[14] |
| Control accuracy | — | +/-1.0°C[14] |
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