Comparison ledger
Multitest MT 9918, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT 9918Multitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest MT 9918 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | OCTAL A+H BASE 2 IN I[1] | — |
| Model | MT 9918[1] | JR-A-F4T[3] |
| Equipment type | Handler[1] | — |
| Description | Modular high speed handler[2] | — |
| Contact sites | 4 or 8 asynchronous contact sites[2] | — |
| Throughput | Up to 28,000 uph[2] | — |
| Package handling | SO packages, CSPs, BGAs, QFNs (MLP/MLF), and SOTs[2] | — |
| Temperature versions | Ambient, ambient/hot, or tri-temp[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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