Comparison ledger
Multitest MT 9928, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT 9928Multitest | |
|---|---|---|
| OEM | Multitest | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest MT 9928 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | No change kit[1] | — |
| Type | Gravity DUT handler[2] | — |
| Number of sites | Octal (8 parallel contact sites)[2] | — |
| Temperature capability | Tri-temp[2] | — |
| Throughput | Up to 28,000 uph[2] | — |
| Standard package support | SOICs from MSOP118 to SO430; QFN from 2mm x 2mm to 11mm x 11mm[2] | — |
| Bowl feeder package support | SOT223, SOT23, and small MLF 3x3 packages[2] | — |
| Loader/unloader configuration | Standard tube or metal magazine loader/unloader[2] | — |
| Contactors | DURA contactors available[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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