Waferpedia

Comparison ledger

Eclipse L 200 N Optical versus NRM 3100 SP+ Overlay Measurement

Nikon Eclipse L 200 N Optical and Nikon NRM 3100 SP+ Overlay Measurement, side by side. Every value shown is drawn from its cited encyclopedia entry.

Side-by-side comparison of selected equipment models
Attribute
OEMNikonNikon
CategoryMetrology & InspectionMetrology & Inspection
Wafer size
Process node
Introduced
Production run
Lifecycle
Lifecycle milestones
Control system
Generation
FamilyNikon Eclipse L 200Nikon NRM 3100 SP+ Overlay Measurement
Specifications
Configuration16M Pixel Camera[1]50/60 Hz[2]
Phase1 Phase[2]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing