Comparison ledger
OGP 0020 Contour Projector, Perkin Elmer Lambda 1050 UV-VIS-NIR Spectrophotometer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Lambda 1050 UV-VIS-NIR SpectrophotometerPerkin Elmer | |
|---|---|---|
| OEM | OGP | Perkin Elmer |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | Ideal for photovoltaic, wafer, and coating characterization (solar cell reflectance and antireflection studies) |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | OGP (Optical Gaging Products) 0020 Contour Projector | Perkin Elmer Lambda |
| Specifications | ||
| Configuration | 50-60 Cycle[1] | With Integrating Sphere[3] |
| Voltage | 115 V[1] | — |
| OEM | OGP (Optical Gaging Products)[2] | — |
| Model | 0020[2] | — |
| Equipment type | Contour Projector[2] | — |
| Category | Precision Optics[1] | — |
| Wafer size | — | Ideal for photovoltaic, wafer, and coating characterization (solar cell reflectance and antireflection studies)[4] |
| Detector module | — | Interchangeable 3-detector module with PMT, InGaAs, and PbS detectors[4] |
| Sample handling | — | Horizontal sampling plate for delicate samples[4] |
| Optional accessories | — | Integrating sphere (150 mm / 6 inch); Universal Reflectance Accessory (URA) for automated multi-angle reflectance[4] |
| Instrument type | — | UV-VIS-NIR spectrophotometer[4] |
| Wavelength coverage | — | Ultraviolet, visible, and near-infrared wavelengths[5] |
| Measurement modes | — | Reflectance, transmission, and absorption measurements[4] |
| Accessory | — | Universal Reflectance Accessory (URA) with patented automated multi-angle reflectance measurement system[4] |
| Integrating sphere | — | 150 mm (6 inch) integrating sphere[4] |
Plan your fab
Building a Precision Optics process? Get a complete equipment list.
Open the fab equipment planner →