Comparison ledger
Olympus scope1 and Olympus SZ6045TR, side by side. Every value shown is drawn from its cited encyclopedia entry.
| Attribute | scope1Olympus | SZ6045TROlympus |
|---|---|---|
| OEM | Olympus | Olympus |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Olympus scope1 | Olympus SZ6045TR |
| Specifications | ||
| Vendor | Olympus[1] | — |
| Model | MX61A[1] | SZ6045TR[2] |
| Purpose | Semiconductor microscope for sample inspection and documentation[1] | — |
| Observation methods | Brightfield and darkfield[1] | — |
| Objectives | 5x, 20x, 50x, 100x, and 150x objectives on motorized turret[1] | — |
| Stage focus | Motorized stage focus[1] | — |
| Digital imaging | Steam Motion software for calibrated measurements[1] | — |
| OEM | — | Olympus[2] |
| Category | — | Binocular microscope[2] |
| Location | — | Z17[2] |
Plan your fab
Building a Metrology & Inspection process? Get a complete equipment list.
Open the fab equipment planner →