Comparison ledger
RECIF G 3 Plus Wafer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | G 3 Plus WaferRECIF | |
|---|---|---|
| OEM | RECIF | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | RECIF G 3 Plus Wafer | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Voltage | 110V AC[1] | — |
| Frequency | 60Hz[1] | — |
| Phase | 1 Phase[1] | — |
| Wires | 2 and Earth[1] | — |
| Full Load Current | 7A[1] | — |
| Largest Load Current | 6A[1] | — |
| Configuration | Win XP[2] | — |
| Operating System | Win XP[1] | — |
| Wafer Size | 300mm[4] | — |
| Load Ports | 4 Foup (two front, two rear)[4] | — |
| Cleanroom Class | Class 10[4] | — |
| Software | WISE 300[4] | — |
| Sorting Capability | Programmable sorting[4] | — |
| Vintage | 2007[4] | — |
| Chamber Size | — | 1.2 cubic feet[5] |
| Temperature Range | — | -68°C to +180°C[5] |
| Control | — | +/-1.0°C[5] |
| Manufacturer | — | Tenney[5] |
| Model | — | JR-A-F4T[5] |
| Short description | — | Junior compact temperature test chambers[5] |
| Control accuracy | — | +/-1.0°C[5] |
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