Comparison ledger
Seiko Epson NS 6040, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NS 6040Seiko Epson | |
|---|---|---|
| OEM | Seiko Epson | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Seiko Epson NS 6040 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Single Phase[1] | — |
| Voltage | 220 Vac[1] | — |
| Power | 6KVA max[1] | — |
| Power requirement | 220 VAC[4] | — |
| Power requirement (alternate) | Single Phase - 220 Vac - 50/60 Hz - 6KVA max[1] | — |
| Air supply | 0.49 Mpa[4] | — |
| Operating System | Windows 95[3] | — |
| CPU | Pentium[4] | — |
| RAM | 64MB[4] | — |
| Drive Unit | 3-Layer[4] | — |
| Vintage | 2000[1] | — |
| Communication | GPIB Communication[3] | — |
| Socket Heater | Yes (on some units)[4] | — |
| Power Phase | Single Phase[1] | — |
| Frequency | 50/60 Hz[1] | — |
| Max Power | 6 KVA[1] | — |
| Communication Interface | GPIB[3] | — |
| Temperature Zones | Dual[3] | — |
| Vintage Year | 2000[1] | — |
| Equipment type | Handler[5] | — |
| Make | Seiko / Epson[5] | — |
| Model | NS 6040[5] | JR-A-F4T[6] |
| Control system | Windows 95[3] | — |
| Temperature configuration | Dual Temp[3] | — |
| Chamber Size | — | 1.2 cubic feet[6] |
| Temperature Range | — | -68°C to +180°C[6] |
| Control | — | +/-1.0°C[6] |
| Manufacturer | — | Tenney[6] |
| Short description | — | Junior compact temperature test chambers[6] |
| Control accuracy | — | +/-1.0°C[6] |
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