Comparison ledger
Seiko Epson TR 60 High Speed, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TR 60 High SpeedSeiko Epson | |
|---|---|---|
| OEM | Seiko Epson | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Seiko Epson TR 60 High Speed | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Additional hardware i.e. change kits:[1] | — |
| Make | Seiko / Epson[1] | — |
| Model | TR 60[1] | JR-A-F4T[2] |
| Equipment type | High Speed IC Handler[1] | — |
| Additional hardware i.e. change kits | 3x3 QFN; 4x4 QFN; 6x6 QFN; 7x7 QFN; 8x8 QFN; 9x9 QFN; 10x10 BGA[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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