Comparison ledger
Semics Opus 3 SD, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Opus 3 SDSemics | |
|---|---|---|
| OEM | Semics | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Semics Opus | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 200 - 240V[1] | — |
| Ambient & Hot Temperature Capability | Up to 150°C[2] | — |
| HTF Chuck Temperature Control | Up to 125°C[2] | — |
| HTF Chuck Force | 300 kg[2] | — |
| Power | 200 - 240V[2] | — |
| Current | 15A[2] | — |
| Frequency | 50/60Hz[2] | — |
| Accuracy | 1 µm[3] | — |
| Chuck size | 180 x 175 mm[3] | — |
| Operating temperature | -40 to 200 Degree C[3] | — |
| Overall dimensions | 1530 x 1782 x 960 mm[3] | — |
| Probing force | 450 kgf[3] | — |
| Type | Automatic[3] | — |
| Wafer size | 6 Inches, 8 Inches, 12 Inches[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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