Comparison ledger
Semics Opus 3 SH, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Opus 3 SHSemics | |
|---|---|---|
| OEM | Semics | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Semics Opus | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Flat top plate for bigger test head application[2] | — |
| Full Load Current | 11 A[2] | — |
| Max Ampere Rating | 25 A[2] | — |
| Interruption Capacity | 10 kA[2] | — |
| Type | Automatic[1] | — |
| Wafer size | 6 Inches, 8 Inches, 12 Inches[1] | — |
| Accuracy | 1 µm[1] | — |
| Chuck size | 175 x 175 mm[1] | — |
| Operating temperature | -40 to 200 Degree C[1] | — |
| Overall dimensions | 1490 x 1680 x 960 mm[1] | — |
| Probing force | 450 kgf[1] | — |
| Part number | OPUS3 SH[1] | — |
| Manufacturer | SEMICS Inc[1] | Tenney[3] |
| Voltage | 200~240 V[2] | — |
| Frequency | 50/60 Hz[2] | — |
| Chuck type | 12 inch nickel hot chuck[2] | — |
| Ampere rating | 15 A[2] | — |
| Vintage | 2019[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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