Comparison ledger
Signatone H150W, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | H150WSignatone | |
|---|---|---|
| OEM | Signatone | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | 4-inch | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Signatone H150W | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Model | H150W[1] | JR-A-F4T[3] |
| Type | Hybrid probe station[1] | — |
| Application | 4-inch applications[1] | — |
| Chuck | 4-inch, round, nickel plated chuck[1] | — |
| X-Y motion control | Manual X-Y motion control[1] | — |
| Theta adjustment | Manual theta adjustment[1] | — |
| Micropositioners | 4 x S-725C#M micropositioners with X-Y-Z motion control[1] | — |
| Platen lift | Quick platen lift raises the probes off the device before moving the device in X or Y directions[1] | — |
| Microscope stage | 4-inch, X-Y push microscope stage[1] | — |
| Microscope | SMZ143 Motic Stereozoom with built-in CCD port and 4:1 manual zoom[1] | — |
| Platen lift travel | Coarse, quick platen lift of 3/8"; fine platen lift of 1.25"[1] | — |
| Platen capacity | Holds up to 8 micropositioners[1] | — |
| Device hold-down | Vacuum toggle switch for device hold on chuck[1] | — |
| Warranty | 1 year limited warranty[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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