Comparison ledger
Signatone S-1160, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | S-1160Signatone | |
|---|---|---|
| OEM | Signatone | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Signatone S-1160 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Optics configuration | Can be fitted with either high powered optics or lower powered optics[1] | — |
| Applications stated | RF probing, low current (femtoamp range) probing, failure analysis, thermal probing and other uses[1] | — |
| Micropositioner compatibility | Accepts both magnetic base and vacuum base micropositioners[1] | — |
| Vacuum ports | Equipped with vacuum ports for up to twelve vacuum base micropositioners[1] | — |
| Equipment type | Probe station[1] | — |
| Chamber Size | — | 1.2 cubic feet[2] |
| Temperature Range | — | -68°C to +180°C[2] |
| Control | — | +/-1.0°C[2] |
| Manufacturer | — | Tenney[2] |
| Model | — | JR-A-F4T[2] |
| Short description | — | Junior compact temperature test chambers[2] |
| Control accuracy | — | +/-1.0°C[2] |
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