Comparison ledger
Spea 4060 Flying, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 4060 FlyingSpea | |
|---|---|---|
| OEM | Spea | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Spea 4060 Flying | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 4 Probes with Active Shield — reduces noise in high-precision analogue measurements (not standard)[1] | — |
| Double Booster | ±40V/3A/100W + ±100V/1A/100W — for power component testing (IGBT, MOSFET, power devices)[1] | — |
| Full self-test | all systems PASS — zero errors[1] | — |
| Manufacturer | Spea[1] | Tenney[3] |
| Model | 4060 Flying[1] | JR-A-F4T[3] |
| Category | Test & Probe[2] | — |
| Type | Flying probe tester[2] | — |
| Probe count | 4 probes[2] | — |
| Active shield | 4 probes with Active Shield[1] | — |
| Frequency Divider option | On the 64-ch Scanner[1] | — |
| Driver | ±50V[1] | — |
| DVM | ±100V, AC/DC, 2µs[1] | — |
| Firmware | 09.12 (build 16620)[1] | — |
| Self-test status | All systems PASS; zero errors[1] | — |
| Software | Leonardo YA 2018 Vintage[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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