Comparison ledger
SUSS MicroTec PA 200, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | PA 200SUSS MicroTec | |
|---|---|---|
| OEM | SUSS MicroTec | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | SUSS MicroTec PA 200 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 400 VA[1] | — |
| Voltage | 110 V[1] | — |
| Frequency | 60 Hz[1] | — |
| Power consumption | 400 VA[1] | — |
| Dimensions (H x W x D) | 54 in x 32 in x 32 in[2] | — |
| Weight | 163.29 kg[2] | — |
| Operation type | Semi-automatic[2] | — |
| Country of origin | United States[2] | — |
| Dimensions | 54 x 32 x 32 inches[2] | — |
| Type | Prober[1] | — |
| Operation | SemiAutomatic[2] | — |
| Use | Precise semiconductor wafer testing and electrical measurement[2] | — |
| Power | 400 VA[3] | — |
| Electrical | 110 V, 60 Hz[3] | — |
| Vintage | 1997[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →