Comparison ledger
Tektronix 370 A Programmable Curve Tracer, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 370 A Programmable Curve TracerTektronix | |
|---|---|---|
| OEM | Tektronix | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix 370 A Programmable Curve Tracer | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Built onto a cart[1] | — |
| Collector Supply Modes | AC, ±DC, ±Leakage, ±Rectified Sine[2] | — |
| Maximum Peak Current (16 V range) | 10 A (20 A pulsed)[2] | — |
| Maximum Peak Current (80 V range) | 2 A (4 A pulsed)[2] | — |
| Maximum Peak Current (400 V range) | 0.4 A (0.8 A pulsed)[2] | — |
| Maximum Peak Current (2000 V range) | 0.05 A (0.1 A pulsed)[2] | — |
| Step Generator Modes | Stair step: DC, 80 µs pulse, 300 µs pulse[2] | — |
| Step Range (Current) | 50 nA to 200 mA in 1-2-5 sequence[2] | — |
| Step Range (Voltage) | 50 mV to 2 V in 1-2-5 sequence[2] | — |
| Offset | Up to ±10X step amplitude[2] | — |
| Number of Steps | 0 to 10[2] | — |
| Collector Current Measurement Range | 100 nA/div (1 nA resolution) to 2 A/div[2] | — |
| Collector Current Accuracy | 1.5% of cursor readout +0.05 div of setting (with dot cursor)[2] | — |
| Emitter Current Measurement Range | 1 nA/div (10 pA resolution) to 2 mA/div[2] | — |
| Emitter Current Accuracy | 1.5% of cursor readout +0.05 div of setting +1 nA[2] | — |
| Measurement Resolution | 1 nA current resolution, 2 mV voltage resolution[2] | — |
| Safety Certifications | UL1244, CSA231, HD401 S1 K475[2] | — |
| Interface | IEEE Standard 488.1-1987, RS-232-C, Tektronix Standard Codes and Formats[2] | — |
| Storage | 3.5-inch MS DOS-compatible disk, nonvolatile memory[2] | — |
| Test Fixture Adapters | A1001-A1005 (Kelvin sensing), 3-Pin adapters (non-Kelvin), A1023/A1024 surface mount adapters[2] | — |
| Accessories | K475 Instrument Cart[2] | — |
| Display Features | Waveform Comparison, Envelope Display, Waveform Averaging, Dot Cursor[2] | — |
| EMC Compliance | Directive 89/336/EEC, EN 55011 Class B (radiated and conducted), EN 60555-2[3] | — |
| Installation Category | CAT II (as defined in IEC 1010-1, Annex J)[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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