Comparison ledger
Tektronix DSA 602, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | DSA 602Tektronix | |
|---|---|---|
| OEM | Tektronix | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix DSA 602 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Line Voltage | 90–250v[1] | — |
| Frequency | 48–440hz[1] | — |
| Power | 650va[1] | — |
| Sample rate | 2 gigasamples per second[2] | — |
| Amplifier modules accepted | IIA52 and IIA72[2] | — |
| Effective bits at 500 MS/s, 90% full scale, 242 MHz with IIA72 | 6.59 bits[2] | — |
| Effective bits at 1 GS/s, 90% full scale, 492 MHz with IIA72 | 6.10 bits[2] | — |
| Effective bits at 2 GS/s, 90% full scale, 992 MHz with IIA72 | 4.27 bits[2] | — |
| Effective bits at 500 MS/s, closest to Nyquist, 242 MHz with IIA52 | 6.65 bits[2] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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