Comparison ledger
Tektronix DSA 70804 B Digital Serial Analyzer Oscilloscope, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | Tektronix | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix DSA | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | 8 GHz, 25 GS/s[1] | — |
| Operating System | Windows XP SP3[1] | — |
| Software Version | 5.3.5 build 22[1] | — |
| 2XL | 20 Meg Max 20M/CH[1] | — |
| ASM | Advanced Search & Mark[1] | — |
| DJA | Jitter and Eye Diagram Tools - Advanced[1] | — |
| MTH | Serial Mask Testing[1] | — |
| PTH1 | 3.125Gb/s Serial Pattern Trigger[1] | — |
| TDSPTD | Protocol Trigger and Decode[1] | — |
| Manufacturer | Tektronix[1] | Tenney[4] |
| Model | DSA 70804 B[1] | JR-A-F4T[4] |
| Instrument type | Digital Serial Analyzer / Oscilloscope[1] | — |
| Category | Test & Probe[2] | — |
| Bandwidth | 8 GHz[1] | — |
| Sampling rate | 25 GS/s[1] | — |
| Installed options | 2XL: 20 Meg Max 20M/CH; ASM: Advanced Search & Mark; DJA: Jitter and Eye Diagram Tools - Advanced; MTH: Serial Mask Testing; PTH1: 3.125Gb/s Serial Pattern Trigger; TDSPTD: Protocol Trigger and Decode[1] | — |
| Self-test status | Unit passes all self tests[1] | — |
| Channel status | All channels have been tested and are working[1] | — |
| Calibration status | Unit passes SPC (Signal Path Compensation) calibration[1] | — |
| Type | Digital Serial Analyzer / Oscilloscope[1] | — |
| Analog bandwidth | 8 GHz[3] | — |
| Analog sample rate | 25 GS/s[3] | — |
| Input channels | 4[3] | — |
| Standard record length per channel | 31 MS on all four channels[3] | — |
| Operating system on listed unit | Windows XP SP3[1] | — |
| Software version on listed unit | 5.3.5 build 22[1] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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