Comparison ledger
Tektronix TDS 620 B Oscilloscope, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TDS 620 B OscilloscopeTektronix | |
|---|---|---|
| OEM | Tektronix | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix TDS | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Configuration | Two Channel[1] | — |
| Channels | Two channel[1] | — |
| Instrument type | Digital real time oscilloscope[1] | — |
| Input voltage | 90-250V[1] | — |
| Input frequency | ~47-440Hz[1] | — |
| Maximum power | Max 220VA[1] | — |
| Bandwidth | 500 MHz[2] | — |
| Sample rate | 2 GSa/s[2] | — |
| Acquisition type | Digital real time[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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