Comparison ledger
Tektronix TDS 784 D Digital Oscilloscope, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TDS 784 D Digital OscilloscopeTektronix | |
|---|---|---|
| OEM | Tektronix | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tektronix TDS 784 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants |
| — |
| Specifications | ||
| Configuration | 4 channel[2] | — |
| Type | Digital phosphor oscilloscope[1] | — |
| Channels | 4[1] | — |
| Bandwidth | 1 GHz[1] | — |
| Sample rate | up to 4 GS/s[1] | — |
| Maximum waveform capture rate | 200,000[1] | — |
| Vertical accuracy | 1%[1] | — |
| Vertical resolution | 8-bit; over 11 bits with averaging and over 13 bits with hi-res[1] | — |
| Peak detect | 1 ns[1] | — |
| Sensitivity | 1 mV/div to 10 V/div[1] | — |
| Record length | up to 8 M points[1] | — |
| Storage | Floppy disk storage; Iomega Zip and Zip Plus drive compatible[1] | — |
| GPIB | Full GPIB programmability[1] | — |
| Warranty | 3 year warranty[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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