Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne ASM 2160, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ASM 2160Teradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne ASM |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | Programmable logic controller[5] |
| Manufacturer | Tenney[1] | Teradyne[4] |
| Model | JR-A-F4T[1] | ASM 2160[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | Compatible with Teradyne Eagle ETS 364Tester[2] |
| Test channels | — | Up to 16 independent[3] |
| Test card slots | — | Up to 16[3] |
| Recipe storage | — | Up to 16 recipes[3] |
| I/O interfaces | — | Ethernet, USB, LVDS, GPIB[3] |
| Compatibility | — | Teradyne Eagle ETS 364 tester[4] |
| Design application | — | Automotive electronics[5] |
| Power supply | — | Integrated AC/DC[5] |
| Software tools | — | Multi-site management, PC operation support[5] |
| Data export | — | Network printer, Microsoft Word, Excel[3] |
| Category | — | Test & Probe[4] |
| User-programmable capabilities | — | Yes[4] |
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