Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne ETS 88 TH AC 2500, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ETS 88 TH AC 2500Teradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne ETS 88 |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Teradyne[3] |
| Model | JR-A-F4T[1] | ETS 88 TH AC 2500[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Compatability | — | Test MOSfet bellow 1Kw[2] |
| FT Test Condition | — | 1KV, 12A Test Capability, External LCR Meter, UIS Test[2] |
| QA Test Condition | — | 1KV, 12A Test Capability[2] |
| Computer Type | — | CMPTR, TWR, TALON5 MST, WIN7[2] |
| Configuration | — | Calibration Board (ASM7095 Cal/Diag Board) Available[2] |
| Compatibility | — | Test MOSfet bellow 1Kw[2] |
| Calibration Board | — | ASM7095 Cal/Diag Board Available[2] |
| Sector Configuration | — | Two Sector[2] |
| Missing Modules | — | No QPU & QTMU; No HPU< APU, QMS[2] |
| Vintage | — | 2017[2] |
| Equipment type | — | semiconductor tester[3] |
| Category | — | Test & Probe[3] |
| Test capability | — | 1KV, 12A[3] |
| Calibration board | — | ASM7095 Cal/Diag Board[2] |
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