Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne J 750 E, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | J 750 ETeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne J 750 E |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Teradyne[2] |
| Model | JR-A-F4T[1] | J 750 E[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | 512ch[2] |
| Category | — | Test & Probe[3] |
| Channels | — | 512ch[3] |
| Modules | — | 8 x HSD100; 4 x CTO; 4 x DPS; XW8400; In Test Manipulator[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →