Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne J 750 EX HD, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | J 750 EX HDTeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne J 750 EX HD |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | — |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | HSD 800 x8 pcs[2] |
| Platform designation | — | J750Ex-HD Platform[3] |
| Product category | — | Digital/Mixed Signal Test[3] |
| Documented configuration | — | HSD 800 x8, HDDPS 24 x2, Trea 3 workstation, manipulator[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →