Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Magnum 5 EV Memory, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Magnum 5 EV MemoryTeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Magnum |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Teradyne[2] |
| Model | JR-A-F4T[1] | Magnum 5 EV[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Mainframe | — | 512 ZIF Interface Support[2] |
| Quad Site Assembly config | — | 1.6Gbps, HSBx, DPS128ER, 17[2] |
| Configuration | — | 512 digital channels[2] |
| ECR or DBM | — | 518311 option, 64 bit, ECR or DBM, M5[2] |
| Row/Column Memory (RCM) Option | — | 518317 option, 64MB, RCM, M5[2] |
| Description | — | Memory Tester[3] |
| Test site controller | — | 1[2] |
| Algorithmic pattern generators | — | 4[2] |
| DUT power supplies | — | 128[2] |
| System PMU | — | 32[2] |
| High voltage pins | — | 128[2] |
| Host computer | — | Windows Server 2012, Visual Studio 2013, UI6.x[2] |
| Memory option | — | 518311 option, 64 bit, ECR or DBM, M5[2] |
| System option | — | 518337 Single 22" LED monitor[2] |
| Vintage | — | 01.06.2018[3] |
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