Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Nextest Magnum 2 PV, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Nextest Magnum 2 PVTeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Nextest Magnum |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | Magnum 2 PV[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | SA board (2) ,511501[2] |
| OEM | — | Teradyne / Nextest[2] |
| Category | — | Test & Probe[3] |
| Included boards and components | — | SA board (2), 511501; IPC board (1); Manipulator (1); Dell workstation (1)[2] |
| Memory options | — | 4 Error Capture Memory Option 510008 OPTION,ECR,36GB/1.152GB; 4 Row/Column Memory Option 510016 OPTION,RCM,36M, HD2; 4 Data Buffer Memory Option 510012 OPTION,DBM,18GB/1.152GB; 4 Vector Memory Option 510019 OPTION,LVM,64MV/128MV[4] |
| System option | — | 1 518337 single 22-inch LED monitors[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →