Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Nextest Magnum V EV, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Nextest Magnum V EVTeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Nextest Magnum |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | Magnum V EV[3] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Voltage | — | 220 V[2] |
| Configuration | — | 50/60 Hz[2] |
| Voltage / Frequency | — | 220 V, 50/60 Hz[2] |
| Test Instrument Unit (TIU) | — | 522203-198 512ch TIU (2013 Vintage)[2] |
| Option module | — | 525419 Mag V option module (2 included)[2] |
| Other modules | — | 522408 SA HSBX DP128ER PED (2)[2] |
| Workstation | — | Dell Control Workstation[2] |
| Chiller | — | Chiller[2] |
| Power supply | — | 220V, 50/60 Hz[2] |
| Test Interface Unit channels | — | 512[2] |
| TIU vintage | — | 2013[2] |
| Chiller vintage | — | 2013[2] |
| Control workstation | — | Dell[2] |
| Make | — | Teradyne / Nextest[3] |
| Frequency | — | 50/60 Hz[2] |
| TIU channel count | — | 512[2] |
| OEM | — | Teradyne / Nextest[3] |
| Asset # | — | 133059[3] |
| Last Confirm Date | — | May 07, 2025[3] |
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