Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Nextest Maverick II, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Nextest Maverick IITeradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Nextest Maverick |
| Cited variants | — | |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[3] | — |
| Temperature Range | -68°C to +180°C[3] | — |
| Control | +/-1.0°C[3] | — |
| Manufacturer | Tenney[3] | — |
| Model | JR-A-F4T[3] | Maverick II[1] |
| Short description | Junior compact temperature test chambers[3] | — |
| Control accuracy | +/-1.0°C[3] | — |
| P/N | — | 501682 / 501872[1] |
| Configuration | — | APG[1] |
| Part number (APG configuration) | — | 501682 / 501872 - APG[1] |
| Part number (PE 16 configuration) | — | 501683 / 501873 - PE 16[2] |
| Category | — | Test & Probe[4] |
| Make | — | Teradyne / Nextest[1] |
| Part number | — | 501682 / 501872 - APG[4] |
| Pin count | — | 128 I/O Pins[5] |
| Data rate | — | 33mhz / 66Mhz / 66Mhz DDR[5] |
| Process vintage | — | 2010[5] |
| Wafer size | — | N/A[5] |
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