Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Spectrum 8855, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Spectrum 8855Teradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Spectrum |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Teradyne[2] |
| Model | JR-A-F4T[1] | Spectrum 8855[2] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Power | — | 5.50v, 200.00w[2] |
| Configuration | — | Hardware scan table[2] |
| 5.50V power rail | — | 200W[2] |
| 24V power rail | — | 50W[2] |
| 52V power rail | — | 200W[2] |
| VXI card cage | — | Extended for 3rd party C-sized VXI instruments[4] |
| Hardware scan table | — | Included[2] |
| VXI-MXI-2 | — | Included[2] |
| Board configuration (asset 75212) | — | FIB/DeltaScan board, VP board (3), CC2a master and expander board (36)[2] |
| Board configuration (asset 75211) | — | High voltage PRISM board, VP board (2), CC2a master and expander board (24)[3] |
| Equipment type | — | Tester[2] |
| Hardware | — | Hardware scan table; VXI-MXI-2; FIB / DeltaScan board; VP board (3); CC2a master and expander board (36)[2] |
| Vintage | — | 2005[2] |
| Test capabilities | — | Analog test; vectorless test; digital and mixed-signal vector test; boundary-scan test[4] |
| Device programming | — | In-line device programming of Flash, EEPROM, and FPGAs[4] |
| Card cage | — | Extended VXI card cage for integration of 3rd party C-sized VXI instruments[4] |
| Product type | — | Tester[2] |
| Feature set | — | Analog test, vectorless test, digital and mixed-signal vector test, and boundary-scan test capabilities[4] |
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