Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Teradyne Ultra Flex BB 512, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Ultra Flex BB 512Teradyne | |
|---|---|---|
| OEM | Tenney | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Teradyne Ultra Flex |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | — |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Slot 0 | — | GigaDig HD 2[2] |
| Slot 4 | — | HSS 6400[2] |
| Slot 6 | — | HSD-M[2] |
| Slot 7 | — | HSD-M[2] |
| Slot 8 | — | HSD-M[2] |
| Slot 9 | — | HSD-M[2] |
| Slot 11 | — | Turbo-Frame[2] |
| Slot 14 | — | HSD-M[2] |
| Slot 15 | — | HSD-M[2] |
| Slot 16 | — | HSD-M[2] |
| Slot 17 | — | HSD-M[2] |
| Slot 18 | — | DC-30[2] |
| Slot 19 | — | HexVS[2] |
| Slot 20 | — | DC-30[2] |
| Slot 21 | — | HexVS[2] |
| Slot configuration | — | Slot 0: GigaDig HD 2; Slot 4: HSS 6400; Slot 6: HSD-M; Slot 7: HSD-M; Slot 8: HSD-M; Slot 9: HSD-M; Slot 11: Turbo-Frame; Slot 14: HSD-M; Slot 15: HSD-M; Slot 16: HSD-M; Slot 17: HSD-M; Slot 18: DC-30; Slot 19: HexVS; Slot 20: DC-30; Slot 21: HexVS[2] |
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