Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Test Research Inc (TRI) TRI 518 FE MDA, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Inc (TRI) TRI 518 FE MDATest Research | |
|---|---|---|
| OEM | Tenney | Test Research |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Test Research Inc |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Test Research Inc (TRI)[3] |
| Model | JR-A-F4T[1] | TRI 518 FE[3] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | Computer NG, IDLE three years[2] |
| Type | — | MDA Tester (Manufacturing Defect Analyzer)[3] |
| Vintage | — | 2005[3] |
| Computer status | — | NG (not good)[2] |
| Idle duration | — | 3 years[3] |
| Computer state | — | IDLE[2] |
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