Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Tokyo Electron P 12 XLn, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | P 12 XLnTokyo Electron | |
|---|---|---|
| OEM | Tenney | Tokyo Electron |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Tokyo Electron P 12 |
| Cited variants | — | |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[3] | — |
| Temperature Range | -68°C to +180°C[3] | — |
| Control | +/-1.0°C[3] | — |
| Manufacturer | Tenney[3] | — |
| Model | JR-A-F4T[3] | P 12 XLn[4] |
| Short description | Junior compact temperature test chambers[3] | — |
| Control accuracy | +/-1.0°C[3] | — |
| Configuration | — | 50/60 Hz[4] |
| Rated Breaker Input | — | 30 A[4] |
| Ampere Interrupt Capacity | — | 35 kA[4] |
| Rated Power Input | — | 208 V, 50/60 Hz[5] |
| 12 | — | Nickel Chuck Top[2] |
| Temp | — | -40 ~ 150 C[1] |
| Make | — | Tel[4] |
| Equipment type | — | Prober[1] |
| Frequency | — | 50/60 Hz[4] |
| Vintage | — | 2005[4] |
| Wafer sizes | — | 8, 12 inch[1] |
| Power input | — | 208 V, 50/60 Hz[5] |
| Application note | — | May be used for memory[5] |
| Hot temp controller | — | Included[2] |
| GPIB interface | — | Included[2] |
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