Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Tokyo Electron P 8, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | P 8Tokyo Electron | |
|---|---|---|
| OEM | Tenney | Tokyo Electron |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Tokyo Electron P 8 |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | — |
| Model | JR-A-F4T[1] | P 8[3] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | Gold chuck[2] |
| Wafer Size | — | 8 inch[3] |
| Chuck Type | — | Gold chuck[2] |
| Temperature Control | — | Ambient Temperature[2] |
| Pad Type | — | Clean pad[2] |
| Board Type | — | MVME/VIP Board[2] |
| Vintage | — | 1994, 1997[4] |
| Make | — | Tel[3] |
| Wafer Sizes | — | 8 inch[3] |
| Product type | — | Prober[4] |
| OEM | — | Tokyo Electron[3] |
| Category | — | Test & Probe[3] |
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