Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Veeco Four Point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Four PointVeeco | |
|---|---|---|
| OEM | Tenney | Veeco |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Veeco Four Point |
| Cited variants | — | |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[3] | — |
| Temperature Range | -68°C to +180°C[3] | — |
| Control | +/-1.0°C[3] | — |
| Manufacturer | Tenney[3] | — |
| Model | JR-A-F4T[3] | — |
| Short description | Junior compact temperature test chambers[3] | — |
| Control accuracy | +/-1.0°C[3] | — |
| Function | — | Resistivity and sheet resistance measurement[1] |
| Penetrate voltage | — | 170 V short pulse[1] |
| Semiconductor type determination | — | N or P type[1] |
| Measurement | — | Resistivity[1] |
| Model designation | — | FP-100[1] |
| Measurement modes | — | Sheet resistance, bulk resistivity, thickness, type test[2] |
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