Comparison ledger
Tenney , TPS JR-A-F4T Junior compact temperature test chambers, Zeiss Contura G 2 CMM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Contura G 2 CMMZeiss | |
|---|---|---|
| OEM | Tenney | Zeiss |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Tenney , TPS JR-A-F4T Junior compact temperature test chambers | Zeiss Contura G 2 CMM |
| Specifications | ||
| Chamber Size | 1.2 cubic feet[1] | — |
| Temperature Range | -68°C to +180°C[1] | — |
| Control | +/-1.0°C[1] | — |
| Manufacturer | Tenney[1] | Zeiss[3] |
| Model | JR-A-F4T[1] | Contura G 2[3] |
| Short description | Junior compact temperature test chambers[1] | — |
| Control accuracy | +/-1.0°C[1] | — |
| Configuration | — | 7.7.6 RDS[2] |
| Software | — | Calypso 2019[2] |
| Measuring Range | — | 700 x 700 x 600 mm[3] |
| Equipment type | — | Coordinate Measuring Machine (CMM)[3] |
| Category | — | Dimensional Calibrators[5] |
| Probe head | — | RDS Probe Head[3] |
| Scanning probe | — | Vast XXT Scanning Probe[3] |
| Controller | — | Zeiss Controller[2] |
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