Comparison ledger
Advantest T 5835 Memory, Applied Materials 0720 06060 Part, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5835 MemoryAdvantest | 0720 06060 PartApplied Materials |
|---|---|---|
| OEM | Advantest | Applied Materials |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5835 Memory | Applied Materials 0720 06060 Part |
| Specifications | ||
| Configuration | Power & Cooling cabinet[1] | Contact Pin 24-20 Awg Crimp Gold Flash[3] |
| Phase | 3 Phase[1] | — |
| Type | Memory test system[2] | — |
| Target devices | DRAM, NAND Flash[2] | — |
| Operating speed | Up to 5.4 Gbps[2] | — |
| Parallel testing | Final test: 512/768[2] | — |
| Overall timing accuracy | ±50ps[2] | — |
| Software | FutureSuite OS (ATL and MPAT compatible)[2] | — |
| Configuration options | STH (Small Test Head), LTH (Large Test Head), MTH (Middle Test Head)[2] | — |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →