Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Mitutoyo Formtracer SV-C4500, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | Formtracer SV-C4500Mitutoyo |
|---|---|---|
| OEM | Applied Materials | Mitutoyo |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Mitutoyo Formtracer SV-C4500 |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | Formtracer SV-C4500[5] |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | Mitutoyo[5] |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| X-Travel | — | 100mm (4″)[5] |
| Z Column Height | — | 500mm[5] |
| Machine type | — | Surface roughness profile tester[6] |
| Function | — | Measures surface geometry and calculates surface roughness[6] |
| X-travel | — | 100 mm[5] |
| Vertical detector travel with Contracer head | — | 60 mm[5] |
| Z1 contour measurement range | — | 60 mm[6] |
| Z1 contour resolution | — | 0.02 μm[6] |
| Z1 roughness measurement range | — | 800/80/8 μm[6] |
| Z1 roughness resolution | — | 0.1 μ maximum[6] |
| Probe operation force | — | 0.75 mN[6] |