Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi HF3300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | HF3300Hitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi HF3300 |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[2] | — |
| Instrument Type | — | Transmission electron microscope (TEM)[3] |
| Instrument Code | — | TEM-14[3] |
| Facility Section | — | Charge Beam Imaging[3] |
| Tool designation | — | Hitachi HF3300(S) Megascope[3] |
| Model | — | HF3300(S)[4] |
| Manufacturer | — | Hitachi[4] |
| Instrument type | — | Transmission electron microscope[5] |
| Mode capability | — | Scanning transmission electron microscopy (STEM)[4] |
| Accelerating voltage | — | 300 kV[4] |
| TEM resolution | — | 0.13 nm[4] |
| STEM resolution | — | 0.1 nm[4] |
| Detectors | — | Annular dark field (ADF) detector and bright field (BF) detector[4] |
| EDS | — | Dual Oxford energy dispersive X-ray spectroscopy detectors[4] |
| EELS | — | Electron energy loss spectroscopy detector[4] |
| Microscopy capabilities | — | High resolution Lorentz microscopy and electron holography[4] |
| In-situ heating | — | Possible with a Norcada heating holder with biasing contacts[4] |
| Gas flow injection | — | Air, O2, H2O vapor, CO2, and H2[4] |
| Acceleration voltage | — | 300 kV[1] |
| STEM capability | — | Capable of scanning transmission electron microscopy (STEM)[1] |
| ADF detector | — | Annular dark field (ADF) detector[1] |
| BF detector | — | Bright field detector (BF)[1] |
| EDS detectors | — | Dual Oxford energy dispersive X-ray spectroscopy (EDS) detectors[1] |
| EELS detector | — | Electron energy loss spectroscopy (EELS) detector[1] |
| Lorentz microscopy | — | High-resolution Lorentz microscopy[1] |
| Electron holography | — | Electron holography capability[1] |
| Partial pressure gas flow injection | — | Possible with air, O2, H2O vapor, CO2 and H[1] |
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