Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, JEOL DA-1, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | DA-1JEOL |
|---|---|---|
| OEM | Applied Materials | JEOL |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | Electron microscope |
| Introduced | — | 1947 |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | JEOL DA-1 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| Type | — | prototype magnetic field–type electron microscope[2] |
| Developer context | — | developed by an initial group that included Kenji Kazato and Kazuo Ito in Mobara, Chiba Prefecture, Japan[2] |
| Development status | — | prototype[2] |
| Instrument type | — | magnetic field–type electron microscope[2] |
| First commercialized | — | 1947[2] |
| Historical note | — | described as the origin of developing the electron microscope by JEOL Ltd.[3] |
| Historical recognition | — | registered in 2010 as an Important Historical Scientific and Technical Material (Future Technology Heritage)[4] |
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