Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Mitutoyo Formtracer SV-C4500, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | Formtracer SV-C4500Mitutoyo |
|---|---|---|
| OEM | Applied Materials | Mitutoyo |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Mitutoyo Formtracer SV-C4500 |
| Specifications | ||
| Make | Applied Materials[1] | — |
| Model | 0010-22161[1] | Formtracer SV-C4500[3] |
| Description | HTESC PH 1 REV A[2] | — |
| Condition | Used[2] | — |
| Stock Number | BM6628[2] | — |
| X-Travel | — | 100mm (4″)[3] |
| Z Column Height | — | 500mm[3] |
| Manufacturer | — | Mitutoyo[3] |
| Machine type | — | Surface roughness profile tester[4] |
| Function | — | Measures surface geometry and calculates surface roughness[4] |
| X-travel | — | 100 mm[3] |
| Vertical detector travel with Contracer head | — | 60 mm[3] |
| Z1 contour measurement range | — | 60 mm[4] |
| Z1 contour resolution | — | 0.02 μm[4] |
| Z1 roughness measurement range | — | 800/80/8 μm[4] |
| Z1 roughness resolution | — | 0.1 μ maximum[4] |
| Probe operation force | — | 0.75 mN[4] |