Comparison ledger
Cohu MT9928, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT9928Cohu | |
|---|---|---|
| OEM | Cohu | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cohu MT9928 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Specifications | ||
| Handler type | Gravity test handler[1] | — |
| Use with MEMS modules | Can be configured with Cohu MT9928 tri-temp test handler for automatic loading / unloading[1] | — |
| Temperature range | –40°C to +140°C[1] | — |
| Device size support | Leaded devices 150 mil to 300 mil; leadless devices 3 mm to 11 mm[1] | — |
| Index time | 2.2 s for any package[1] | — |
| Configuration | Can be configured with Cohu MT9928 tri-temp test handler for automatic loading / unloading[1] | — |
| Throughput | Up to 28,000 UPH[2] | — |
| Test sites | Up to 8 test sites[2] | — |
| Temperature accuracy | +/- 2°C[2] | — |
| Installed base | >1,300[2] | — |
| Package sizes | MSOP 118 mil to SO 430 mil; QFN 2 mm to QFN 11 mm; supports lead pitch down to 0.4 mm[2] | — |
| Input and output | Tube, Metal Magazine and Bowl/Bulk[2] | — |
| Kit conversion time | ~1 hour[2] | — |
| MEMS test | Magnetic sensor stimuli for MEMS available[2] | — |
| Supported modules | MEMS and sensor test modules[3] | — |
| Automation | Can be configured with MEMS modules for automatic loading and unloading[3] | — |
| Chamber Size | — | 1.2 cubic feet[4] |
| Temperature Range | — | -68°C to +180°C[4] |
| Control | — | +/-1.0°C[4] |
| Manufacturer | — | Tenney[4] |
| Model | — | JR-A-F4T[4] |
| Short description | — | Junior compact temperature test chambers[4] |
| Control accuracy | — | +/-1.0°C[4] |
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