Comparison ledger
Eagle J750, Tenney , TPS JR-A-F4T Junior compact temperature test chambers, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | J750Eagle | |
|---|---|---|
| OEM | Eagle | Tenney |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | 1998– | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Eagle J750 | Tenney , TPS JR-A-F4T Junior compact temperature test chambers |
| Cited variants | — | |
| Specifications | ||
| Product family | J750[2] | — |
| Platform context | Listed among Teradyne semiconductor test platforms[2] | — |
| Installed base | Over 6,000 test systems[1] | — |
| Maximum pins | 2048 multifunction pins[1] | — |
| Maximum data rate | 400 MHz/800 Mbps[1] | — |
| Test program development time | IG-XL software enables thirty percent faster development of multisite test programs[1] | — |
| Parallelism | Up to 2048 multifunction pins[1] | — |
| Data rate | Data rates up to 400 MHz/800 Mbps[1] | — |
| Chamber Size | — | 1.2 cubic feet[3] |
| Temperature Range | — | -68°C to +180°C[3] |
| Control | — | +/-1.0°C[3] |
| Manufacturer | — | Tenney[3] |
| Model | — | JR-A-F4T[3] |
| Short description | — | Junior compact temperature test chambers[3] |
| Control accuracy | — | +/-1.0°C[3] |
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